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| | |- valign="top | | |- valign="top |
| | | width="100" |'''title (in Turkish)''': | | | width="100" |'''title (in Turkish)''': |
| − | | width="550"|[[Media:Avci_Altun_Reliability Model_for_MOSFET_GOB.pdf | MOSFET Geçit Oksidi Kırılması için Yeni Bir Güvenilirlik Modeli]] | + | | width="550"|[[Media:Avci_Altun_Reliability_Model_for_MOSFET_GOB.pdf | MOSFET Geçit Oksidi Kırılması için Yeni Bir Güvenilirlik Modeli]] |
| | |- valign="top | | |- valign="top |
| | | '''authors''': | | | '''authors''': |
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| | <span class="plainlinks"> | | <span class="plainlinks"> |
| | | | |
| − | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/6/6f/Avci_Altun_Reliability Model_for_MOSFET_GOB.pdf]]</span> | + | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/6/6f/Avci_Altun_Reliability_Model_for_MOSFET_GOB.pdf]]</span> |
| | <br> | | <br> |
| − | [[Media:Avci_Altun_Reliability Model_for_MOSFET_GOB.pdf | Paper]] | + | [[Media:Avci_Altun_Reliability_Model_for_MOSFET_GOB.pdf | Paper]] |
| | | | |
| | | align="center" width="70" | | | | align="center" width="70" | |
| | <span class="plainlinks"> | | <span class="plainlinks"> |
| | | | |
| − | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/f/f9/Avci_Altun_Reliability Model_for_MOSFET_GOB.pptx]] | + | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/f/f9/Avci_Altun_Reliability_Model_for_MOSFET_GOB.pptx]] |
| | </span> | | </span> |
| − | <br> [http://www.ecc.itu.edu.tr/images/f/f9/Avci_Altun_Reliability Model_for_MOSFET_GOB.pptx Slides] | + | <br> [http://www.ecc.itu.edu.tr/images/f/f9/Avci_Altun_Reliability_Model_for_MOSFET_GOB.pptx Slides] |
| | |} | | |} |
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