Publications and Presentations
From The Emerging Circuits and Computation Group at ITU
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<div style="float:center; font-size:110%; font-weight:bold; clear:both; padding:0; margin:0.0em;">__TOC__</div> | <div style="float:center; font-size:110%; font-weight:bold; clear:both; padding:0; margin:0.0em;">__TOC__</div> | ||
== Computing with Nano-Crossbar Arrays == | == Computing with Nano-Crossbar Arrays == | ||
+ | |||
+ | === Technology Development === | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
+ | |||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="550"|[[Media: Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pdf| Realization of Four-Terminal Switching Lattices: Technology Development and Circuit Modeling]] | ||
+ | |- valign="top" | ||
+ | | '''authors''': | ||
+ | | width="550"| Serzat Safaltin, Oguz Gencer, Ceylan Morgul, Levent Aksoy, Sebahattin Gurmen, Csaba Andras Moritz, and [[Mustafa Altun]] | ||
+ | |- valign="top" | ||
+ | | '''presented at''': | ||
+ | | width="550"| [http://www.date-conference.com/ Design, Automation and Test in Europe (DATE)], Florence, Italy, 2019. | ||
+ | |} | ||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/2/2c/Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pdf | Paper]] | ||
+ | | align="center" width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | |||
+ | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/7/71/Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pptx]] | ||
+ | </span> | ||
+ | <br> [http://www.ecc.itu.edu.tr/images/7/71/Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pptx Slides] | ||
+ | |} | ||
=== Comprehensive Performance Optimization=== | === Comprehensive Performance Optimization=== | ||
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=== Fault/Defect/Variation Tolerance === | === Fault/Defect/Variation Tolerance === | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="624"|[[Media:Tunali_Altun_Multiple_type_Defect_Tolerance_in_Nano_Crossbar_Arrays.pdf | A Fast Logic Mapping Algorithm for Multiple-type-Defect Tolerance in Reconfigurable Nano-Crossbar Arrays]] | ||
+ | |- valign="top" | ||
+ | | '''authors''': | ||
+ | | Onur Tunali and [[Mustafa Altun]] | ||
+ | |- valign="top" | ||
+ | | '''appeared in''': | ||
+ | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6245516 IEEE Transactions on Emerging Topics in Computing], Vol. 7, Issue 4, pp. 518–529 2019. | ||
+ | |} | ||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/c/c9/Tunali_Altun_Multiple_type_Defect_Tolerance_in_Nano_Crossbar_Arrays.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Tunali_Altun_Multiple_type_Defect_Tolerance_in_Nano_Crossbar_Arrays.pdf | Paper]] | ||
+ | |} | ||
{| style="border:2px solid #abd5f5; background:#f1f5fc;" | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
Line 194: | Line 243: | ||
| Furkan Peker and [[Mustafa Altun]] | | Furkan Peker and [[Mustafa Altun]] | ||
|- valign="top" | |- valign="top" | ||
− | | ''' | + | | '''appeared in''': |
− | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6687315 IEEE Transactions on Multi-Scale Computing Systems], | + | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6687315 IEEE Transactions on Multi-Scale Computing Systems], Vol. 4, No. 4, pp. 522–532, 2018. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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</span> | </span> | ||
<br> [http://www.ecc.itu.edu.tr/images/6/62/Tunali_Altun_Nano_Crossbar_Yield_Analysis.pptx Slides] | <br> [http://www.ecc.itu.edu.tr/images/6/62/Tunali_Altun_Nano_Crossbar_Yield_Analysis.pptx Slides] | ||
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|} | |} | ||
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|- valign="top" | |- valign="top" | ||
| '''appeared in''': | | '''appeared in''': | ||
− | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems], Vol. 36, Issue 5, pp. | + | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems], Vol. 36, Issue 5, pp. 747–760, 2017. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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=== Logic Synthesis === | === Logic Synthesis === | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="624"|[[Media:Aksoy_Altun_Realizations_with_Switching_Lattices.pdf | Novel Methods for Efficient Realization of Logic Functions Using Switching Lattices]] | ||
+ | |- valign="top" | ||
+ | | '''authors''': | ||
+ | | Levent Aksoy and [[Mustafa Altun]] | ||
+ | |- valign="top" | ||
+ | | '''accepted in''': | ||
+ | | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=12 IEEE Transactions on Computers], 2019. | ||
+ | |} | ||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/e/e0/Aksoy_Altun_Realizations_with_Switching_Lattices.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Aksoy_Altun_Realizations_with_Switching_Lattices.pdf | Paper]] | ||
+ | |} | ||
{| style="border:2px solid #abd5f5; background:#f1f5fc;" | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
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<span class="plainlinks"> | <span class="plainlinks"> | ||
− | [[File:PPT.jpg|60px|link=]] | + | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/5/54/Aksoy_Altun_SAT_based_Synthesis_of_Switching_Lattices.pptx]] |
</span> | </span> | ||
− | <br> | + | <br> [http://www.ecc.itu.edu.tr/images/5/54/Aksoy_Altun_SAT_based_Synthesis_of_Switching_Lattices.pptx Slides] |
− | Slides | + | |
|} | |} | ||
Line 406: | Line 454: | ||
| Ceylan Morgul and [[Mustafa Altun]] | | Ceylan Morgul and [[Mustafa Altun]] | ||
|- valign="top" | |- valign="top" | ||
− | | ''' | + | | '''appeared in''': |
− | | width="624" | [http://www.journals.elsevier.com/integration Integration, the VLSI Journal], | + | | width="624" | [http://www.journals.elsevier.com/integration Integration, the VLSI Journal], Vol. 64, pp. 60–70, 2019. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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|- valign="top" | |- valign="top" | ||
| '''appeared in''': | | '''appeared in''': | ||
− | | [http:// | + | | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=12 IEEE Transactions on Computers], Vol. 61, Issue 11, pp. 1588–1600, 2012. |
<!-- |- valign="top" | <!-- |- valign="top" | ||
| '''presented at''': | | '''presented at''': | ||
Line 528: | Line 576: | ||
|} | |} | ||
− | == Reversible | + | == Reversible Computing == |
+ | |||
+ | === CMOS Fault Tolerance === | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc; " | ||
+ | |||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="624"|[[Media:Parvin_Altun_Perfect_Concurrent_Fault_Detection.pdf| Perfect Concurrent Fault Detection in CMOS Logic Circuits Using Parity Preservative Reversible Gates | ||
+ | ]] | ||
+ | |- valign="top" | ||
+ | | '''authors''': | ||
+ | | Sajjad Parvin and [[Mustafa Altun]] | ||
+ | |- valign="top" | ||
+ | | '''appeared in''': | ||
+ | | [http://ieeeaccess.ieee.org/ IEEE Access], Vol. 7, pp. 163939–163947, 2019. | ||
+ | |} | ||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/3/3c/Parvin_Altun_Perfect_Concurrent_Fault_Detection.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Parvin_Altun_Perfect_Concurrent_Fault_Detection.pdf | Paper]] | ||
+ | |||
+ | |} | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
+ | |||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="550"|[[Media:Parvin_Altun_CMOS_Fault_Tolerance_with_Preservative_Reversible_Gates.pdf | Implementation of CMOS Logic Circuits with Perfect Fault Detection Using Preservative Reversible Gates]] | ||
+ | |- valign="top" | ||
+ | | '''authors''': | ||
+ | | Sajjad Parvin and [[Mustafa Altun]] | ||
+ | |- valign=top | ||
+ | | '''presented at''': | ||
+ | | width="550"| [http://tima.univ-grenoble-alpes.fr/conferences/iolts/iolts19/ IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS)], Rhodes Island, Greece, 2019. | ||
+ | |} | ||
+ | |||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/e/ee/Parvin_Altun_CMOS_Fault_Tolerance_with_Preservative_Reversible_Gates.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Parvin_Altun_CMOS_Fault_Tolerance_with_Preservative_Reversible_Gates.pdf | Paper]] | ||
+ | | align="center" width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | |||
+ | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/f/f4/Parvin_Altun_CMOS_Fault_Tolerance_with_Preservative_Reversible_Gates.pptx]] | ||
+ | </span> | ||
+ | <br> [http://www.ecc.itu.edu.tr/images/f/f4/Parvin_Altun_CMOS_Fault_Tolerance_with_Preservative_Reversible_Gates.pptx Poster] | ||
+ | |} | ||
{| style="border:2px solid #abd5f5; background:#f1f5fc; " | {| style="border:2px solid #abd5f5; background:#f1f5fc; " | ||
Line 542: | Line 643: | ||
| [[Mustafa Altun]], Sajjad Parvin, and Husrev Cilasun | | [[Mustafa Altun]], Sajjad Parvin, and Husrev Cilasun | ||
|- valign="top" | |- valign="top" | ||
− | | ''' | + | | '''appeared in''': |
− | | [http://ieeeaccess.ieee.org/ IEEE Access], 2018. | + | | [http://ieeeaccess.ieee.org/ IEEE Access], Vol. 6, pp. 74475–74484, 2018. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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|- valign="top" | |- valign="top" | ||
| '''appeared in''': | | '''appeared in''': | ||
− | | [http://www.journals.istanbul.edu.tr/iujeee/index Istanbul University - Journal of Electrical & Electronics Engineering], Vol. 17, No. 1, pp. 3147 | + | | [http://www.journals.istanbul.edu.tr/iujeee/index Istanbul University - Journal of Electrical & Electronics Engineering], Vol. 17, No. 1, pp. 3147–3154, 2017. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
Line 575: | Line 676: | ||
|} | |} | ||
+ | |||
+ | === Logic Synthesis === | ||
{| style="border:2px solid #abd5f5; background:#f1f5fc; " | {| style="border:2px solid #abd5f5; background:#f1f5fc; " | ||
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|- valign="top" | |- valign="top" | ||
| '''appeared in''': | | '''appeared in''': | ||
− | | [http://www.oldcitypublishing.com/journals/mvlsc-home/ Journal of Multiple-Valued Logic and Soft Computing], Vol. 29, Issue 1-2, pp. | + | | [http://www.oldcitypublishing.com/journals/mvlsc-home/ Journal of Multiple-Valued Logic and Soft Computing], Vol. 29, Issue 1-2, pp. 1–23, 2017. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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== Approximate Computing == | == Approximate Computing == | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="624"|[[Media:Nojehdeh_Altun_Approximate_Adders_Multipliers.pdf | Systematic Synthesis of Approximate Adders and Multipliers with Accurate Error Calculations]] | ||
+ | |- valign="top" | ||
+ | | '''authors''': | ||
+ | | Mohammadreza Nojehdeh and [[Mustafa Altun]] | ||
+ | |- valign="top" | ||
+ | | '''appeared in''': | ||
+ | | width="624" | [http://www.journals.elsevier.com/integration Integration, the VLSI Journal], Vol. 70, pp. 99–107, 2020. | ||
+ | |} | ||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/c/c8/Nojehdeh_Altun_Approximate_Adders_Multipliers.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Nojehdeh_Altun_Approximate_Adders_Multipliers.pdf | Paper]] | ||
+ | |} | ||
{| style="border:2px solid #abd5f5; background:#f1f5fc; " | {| style="border:2px solid #abd5f5; background:#f1f5fc; " | ||
Line 782: | Line 905: | ||
| Tuba Ayhan and [[Mustafa Altun]] | | Tuba Ayhan and [[Mustafa Altun]] | ||
|- valign="top" | |- valign="top" | ||
− | | ''' | + | | '''appeared in''': |
− | | [http://ieeeaccess.ieee.org/ IEEE Access], | + | | [http://ieeeaccess.ieee.org/ IEEE Access], Vol. 7, pp. 4726–4734, 2019. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
Line 865: | Line 988: | ||
|- valign="top" | |- valign="top" | ||
| '''presented at''': | | '''presented at''': | ||
− | | width="550"| [http:// | + | | width="550"| [http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001786 Sinyal İşleme ve İletişim Uygulamaları Kurultayı (SİU)], Izmir, Turkey, 2018. |
|} | |} | ||
Line 884: | Line 1,007: | ||
== Large-Area Electronics == | == Large-Area Electronics == | ||
+ | |||
+ | === Transistor Fabrication === | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
+ | |||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="550"|[[Media:Yedikardes_EtAl_P3HT_WO3_Organic_Transistors.pdf | The Enhanced Electronic Properties of P3HT-WO3 Hybrid Thin Film Transistors]] | ||
+ | |- valign="top" | ||
+ | | '''authors''': | ||
+ | | width="550"|Beyza Yedikardes, Fereshteh Ordokhani, Nihat Akkan, Ece Kurt, Esra Zayim, Nilgün Yavuz, and [[Mustafa Altun]] | ||
+ | |- valign=top | ||
+ | | '''presented at''': | ||
+ | | width="550"| [http://www.advanced-nanomaterials-conference.com/ International Conference on Advanced Nanomaterials (ANM)], Aveiro, Portugal, 2019. | ||
+ | |} | ||
+ | |||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/d/d5/Yedikardes_EtAl_P3HT_WO3_Organic_Transistors.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Yedikardes_EtAl_P3HT_WO3_Organic_Transistors.pdf | Abstract]] | ||
+ | | align="center" width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | |||
+ | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/2/25/Yedikardes_EtAl_P3HT_WO3_Organic_Transistors.pptx]] | ||
+ | </span> | ||
+ | <br> [http://www.ecc.itu.edu.tr/images/2/25/Yedikardes_EtAl_P3HT_WO3_Organic_Transistors.pptx Slides] | ||
+ | |} | ||
=== Organic Transistor Modeling === | === Organic Transistor Modeling === | ||
Line 929: | Line 1,082: | ||
|- valign="top" | |- valign="top" | ||
| '''appeared in''': | | '''appeared in''': | ||
− | | [http://journals.tubitak.gov.tr/elektrik/index.htm;jsessionid=848207EBE52EFE10C78B78C76A0FEAD9 Turkish Journal of Electrical Engineering and Computer Sciences], Vol. 25, No. 4, pp. | + | | [http://journals.tubitak.gov.tr/elektrik/index.htm;jsessionid=848207EBE52EFE10C78B78C76A0FEAD9 Turkish Journal of Electrical Engineering and Computer Sciences], Vol. 25, No. 4, pp. 3240–3252, 2017. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
Line 951: | Line 1,104: | ||
|- valign="top" | |- valign="top" | ||
| '''appeared in''': | | '''appeared in''': | ||
− | | [http://www.journals.elsevier.com/reliability-engineering-and-system-safety Reliability Engineering and System Safety], Vol. 156, pp. | + | | [http://www.journals.elsevier.com/reliability-engineering-and-system-safety Reliability Engineering and System Safety], Vol. 156, pp. 175–184, 2016. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
Line 1,068: | Line 1,221: | ||
</span> | </span> | ||
<br> [http://www.ecc.itu.edu.tr/images/e/eb/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pptx Slides] | <br> [http://www.ecc.itu.edu.tr/images/e/eb/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pptx Slides] | ||
+ | |} | ||
+ | |||
+ | ==== National Publications in Turkish ==== | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
+ | |||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="550"|[[Media:Avci_Altun_Reliability Model_for_MOSFET_GOB.pdf | A New Reliability Model for MOSFET Gate Oxide Breakdown]] | ||
+ | |- valign="top | ||
+ | | width="100" |'''title (in Turkish)''': | ||
+ | | width="550"|[[Media:Avci_Altun_Reliability_Model_for_MOSFET_GOB.pdf | MOSFET Geçit Oksidi Kırılması için Yeni Bir Güvenilirlik Modeli]] | ||
+ | |- valign="top | ||
+ | | '''authors''': | ||
+ | | Hasan Avci and [[Mustafa Altun]] | ||
+ | |- valign="top" | ||
+ | | '''presented at''': | ||
+ | | width="550"| [http://www.eleco.org.tr/ Elektrik, Elektronik, Bilgisayar ve Biyomedikal Mühendisliği Sempozyumu (ELECO)], Bursa, Turkey, 2018. | ||
+ | |} | ||
+ | |||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | |||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/6/6f/Avci_Altun_Reliability_Model_for_MOSFET_GOB.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Avci_Altun_Reliability_Model_for_MOSFET_GOB.pdf | Paper]] | ||
+ | |||
+ | | align="center" width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | |||
+ | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/f/f9/Avci_Altun_Reliability_Model_for_MOSFET_GOB.pptx]] | ||
+ | </span> | ||
+ | <br> [http://www.ecc.itu.edu.tr/images/f/f9/Avci_Altun_Reliability_Model_for_MOSFET_GOB.pptx Slides] | ||
|} | |} | ||
Line 1,383: | Line 1,571: | ||
|- valign="top" | |- valign="top" | ||
| '''appeared in''': | | '''appeared in''': | ||
− | | [http://www.springer.com/mathematics/applications/journal/10255 Acta Mathematicae Applicatae Sinica - English Series], Vol. 33, Issue 1, pp. 43 | + | | [http://www.springer.com/mathematics/applications/journal/10255 Acta Mathematicae Applicatae Sinica - English Series], Vol. 33, Issue 1, pp. 43–52, 2017. |
|} | |} | ||
Revision as of 16:30, 5 December 2019
Listed below are the papers, first authored by our group members as an indication that the related research is mainly conducted in our group, and the presentations. Research topics are ordered from newest to oldest as well as by considering their importance. Under each topic, papers are ordered from newest to oldest. All materials are subject to copyrights.
Contents |
Computing with Nano-Crossbar Arrays
Technology Development
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Comprehensive Performance Optimization
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Fault/Defect/Variation Tolerance
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Logic Synthesis
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National Publications in Turkish
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Reversible Computing
CMOS Fault Tolerance
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Logic Synthesis
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National Publications in Turkish
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Stochastic and Bit Stream Computing
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National Publications in Turkish
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Approximate Computing
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National Publications in Turkish
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Large-Area Electronics
Transistor Fabrication
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Organic Transistor Modeling
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Reliability of Electronic Products
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National Publications in Turkish
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Analog Circuit Design
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National Publications in Turkish
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Discrete Mathematics
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