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From The Emerging Circuits and Computation Group at ITU
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+ | <li style="display: inline-block;"> [[File:Main-pub-1-2019.png|link=http://www.ecc.itu.edu.tr/images/7/7d/Altun_Parvin_Cilasun_Exploiting_Reversible_Computing_for_CMOS_Fault_Tolerance.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/7/7d/Altun_Parvin_Cilasun_Exploiting_Reversible_Computing_for_CMOS_Fault_Tolerance.pdf The paper] published in [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639 IEEE Access], 2018]] | ||
+ | <li style="display: inline-block;"> [[File:Main-pub-2-2019.png|link=http://www.ecc.itu.edu.tr/images/d/db/Tunali_Morgul_Altun_Defect_Tolerant_Memristor_Crossbars.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/d/db/Tunali_Morgul_Altun_Defect_Tolerant_Memristor_Crossbars.pdf The paper] published in [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=40 IEEE Micro], 2018]] | ||
+ | <li style="display: inline-block;"> [[File:Main-pub-3-2019.png|link=http://www.ecc.itu.edu.tr/images/7/73/Vahapoglu_Altun_From_Stochastic_To_Bit_Stream_Computing.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/7/73/Vahapoglu_Altun_From_Stochastic_To_Bit_Stream_Computing.pdf The paper] published in [http://arxiv.org/abs/1805.06262 arXiv], 2018]] | ||
+ | <li style="display: inline-block;"> [[File:Main-pub-4-2019.png|link=http://www.ecc.itu.edu.tr/images/7/71/Peker_Altun_Variation_Tolerant_Logic_Mapping_of_Nano_Crossbars.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/7/71/Peker_Altun_Variation_Tolerant_Logic_Mapping_of_Nano_Crossbars.pdf The paper] published in [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6687315 IEEE TMSCS], 2018]] | ||
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<li style="display: inline-block;"> [[File:Main-pub-5-2018.png|link=http://www.ecc.itu.edu.tr/images/7/7d/Altun_Parvin_Cilasun_Exploiting_Reversible_Computing_for_CMOS_Fault_Tolerance.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/7/7d/Altun_Parvin_Cilasun_Exploiting_Reversible_Computing_for_CMOS_Fault_Tolerance.pdf The paper] published in [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639 IEEE Access], 2018]] | <li style="display: inline-block;"> [[File:Main-pub-5-2018.png|link=http://www.ecc.itu.edu.tr/images/7/7d/Altun_Parvin_Cilasun_Exploiting_Reversible_Computing_for_CMOS_Fault_Tolerance.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/7/7d/Altun_Parvin_Cilasun_Exploiting_Reversible_Computing_for_CMOS_Fault_Tolerance.pdf The paper] published in [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639 IEEE Access], 2018]] | ||
<li style="display: inline-block;"> [[File:Main-pub-4-2018.png|link=http://www.ecc.itu.edu.tr/images/d/db/Tunali_Morgul_Altun_Defect_Tolerant_Memristor_Crossbars.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/d/db/Tunali_Morgul_Altun_Defect_Tolerant_Memristor_Crossbars.pdf The paper] published in [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=40 IEEE Micro], 2018]] | <li style="display: inline-block;"> [[File:Main-pub-4-2018.png|link=http://www.ecc.itu.edu.tr/images/d/db/Tunali_Morgul_Altun_Defect_Tolerant_Memristor_Crossbars.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/d/db/Tunali_Morgul_Altun_Defect_Tolerant_Memristor_Crossbars.pdf The paper] published in [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=40 IEEE Micro], 2018]] | ||
<li style="display: inline-block;"> [[File:Main-pub-3-2018.png|link=http://www.ecc.itu.edu.tr/images/7/73/Vahapoglu_Altun_From_Stochastic_To_Bit_Stream_Computing.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/7/73/Vahapoglu_Altun_From_Stochastic_To_Bit_Stream_Computing.pdf The paper] published in [http://arxiv.org/abs/1805.06262 arXiv], 2018]] | <li style="display: inline-block;"> [[File:Main-pub-3-2018.png|link=http://www.ecc.itu.edu.tr/images/7/73/Vahapoglu_Altun_From_Stochastic_To_Bit_Stream_Computing.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/7/73/Vahapoglu_Altun_From_Stochastic_To_Bit_Stream_Computing.pdf The paper] published in [http://arxiv.org/abs/1805.06262 arXiv], 2018]] | ||
<li style="display: inline-block;"> [[File:Main-pub-2-2018.png|link=http://www.ecc.itu.edu.tr/images/7/71/Peker_Altun_Variation_Tolerant_Logic_Mapping_of_Nano_Crossbars.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/7/71/Peker_Altun_Variation_Tolerant_Logic_Mapping_of_Nano_Crossbars.pdf The paper] published in [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6687315 IEEE TMSCS], 2018]] | <li style="display: inline-block;"> [[File:Main-pub-2-2018.png|link=http://www.ecc.itu.edu.tr/images/7/71/Peker_Altun_Variation_Tolerant_Logic_Mapping_of_Nano_Crossbars.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/7/71/Peker_Altun_Variation_Tolerant_Logic_Mapping_of_Nano_Crossbars.pdf The paper] published in [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6687315 IEEE TMSCS], 2018]] | ||
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<li style="display: inline-block;"> [[File:Main-pub-1-2018.png|link=http://www.ecc.itu.edu.tr/images/5/57/Tunali_Altun_Logic_Synthesis_and_Defect_Tolerance_for_Memristive_Crossbars.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/5/57/Tunali_Altun_Logic_Synthesis_and_Defect_Tolerance_for_Memristive_Crossbars.pdf The paper] presented at [http://www.date-conference.com/ DATE], 2018]] | <li style="display: inline-block;"> [[File:Main-pub-1-2018.png|link=http://www.ecc.itu.edu.tr/images/5/57/Tunali_Altun_Logic_Synthesis_and_Defect_Tolerance_for_Memristive_Crossbars.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/5/57/Tunali_Altun_Logic_Synthesis_and_Defect_Tolerance_for_Memristive_Crossbars.pdf The paper] presented at [http://www.date-conference.com/ DATE], 2018]] | ||
<li style="display: inline-block;"> [[File:Main-pub-1.png|link=http://www.ecc.itu.edu.tr/images/c/cc/Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/c/cc/Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf The paper] published in [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43 IEEE TCAD], 2017]] | <li style="display: inline-block;"> [[File:Main-pub-1.png|link=http://www.ecc.itu.edu.tr/images/c/cc/Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf|thumb|none|350px|[http://www.ecc.itu.edu.tr/images/c/cc/Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf The paper] published in [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43 IEEE TCAD], 2017]] |
Revision as of 14:20, 23 December 2019
Welcome to the Emerging Circuits and Computation (ECC) Group | |
Our group, comprised of Mustafa Altun and his scholars & students, is in the Department of Electronics and Communication Engineering at Istanbul Technical University. In terms of research, we aim to develop electronic design automation (EDA) and circuit design techniques especially for future and emerging technologies as well as for new computing paradigms. We also have a special interest in electronics reliability in both circuit and system levels. In terms of teaching, we offer courses on digital/analog circuit design as well as on computational nanoelectronics. ![]() |
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Selected recent publications |
Group pictures |