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| | </span> | | </span> |
| | <br> [http://www.ecc.itu.edu.tr/images/e/eb/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pptx Slides] | | <br> [http://www.ecc.itu.edu.tr/images/e/eb/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pptx Slides] |
| | + | |} |
| | + | |
| | + | ==== National Publications in Turkish ==== |
| | + | |
| | + | {| style="border:2px solid #abd5f5; background:#f1f5fc;" |
| | + | |
| | + | | |
| | + | {| |
| | + | |- valign=top |
| | + | | width="100" |'''title''': |
| | + | | width="550"|[[Media:Avci_Altun_Reliability Model_for_MOSFET_GOB.pdf | A New Reliability Model for MOSFET Gate Oxide Breakdown]] |
| | + | |- valign="top |
| | + | | width="100" |'''title (in Turkish)''': |
| | + | | width="550"|[[Media:Avci_Altun_Reliability Model_for_MOSFET_GOB.pdf | MOSFET Geçit Oksidi Kırılması için Yeni Bir Güvenilirlik Modeli]] |
| | + | |- valign="top |
| | + | | '''authors''': |
| | + | | Ceylan Morgul and [[Mustafa Altun]] |
| | + | |- valign="top" |
| | + | | '''presented at''': |
| | + | | width="550"| [http://www.eleco.org.tr/ Elektrik, Elektronik, Bilgisayar ve Biyomedikal Mühendisliği Sempozyumu (ELECO)], Bursa, Turkey, 2018. |
| | + | |} |
| | + | |
| | + | | align=center width="70" | |
| | + | <span class="plainlinks"> |
| | + | |
| | + | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/6/6f/Avci_Altun_Reliability Model_for_MOSFET_GOB.pdf]]</span> |
| | + | <br> |
| | + | [[Media:Avci_Altun_Reliability Model_for_MOSFET_GOB.pdf | Paper]] |
| | + | |
| | + | | align="center" width="70" | |
| | + | <span class="plainlinks"> |
| | + | |
| | + | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/a/aa/Avci_Altun_Reliability Model_for_MOSFET_GOB.pptx]] |
| | + | </span> |
| | + | <br> [http://www.ecc.itu.edu.tr/images/f/f9/Avci_Altun_Reliability Model_for_MOSFET_GOB.pptx Slides] |
| | |} | | |} |
| | | | |