Publications and Presentations
From The Emerging Circuits and Computation Group at ITU
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| width="100" |'''title''': | | width="100" |'''title''': | ||
− | | width="550"|[[Media: Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pdf| | + | | width="550"|[[Media: Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pdf| Realization of Four-Terminal Switching Lattices: Technology Development and Circuit Modeling]] |
|- valign="top" | |- valign="top" | ||
| '''authors''': | | '''authors''': | ||
− | | Serzat Safaltin, Oguz Gencer, Ceylan Morgul, Levent Aksoy, Sebahattin Gurmen, Csaba Andras Moritz, and [[Mustafa Altun]] | + | | width="550"| Serzat Safaltin, Oguz Gencer, Ceylan Morgul, Levent Aksoy, Sebahattin Gurmen, Csaba Andras Moritz, and [[Mustafa Altun]] |
|- valign="top" | |- valign="top" | ||
| '''presented at''': | | '''presented at''': | ||
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<span class="plainlinks"> | <span class="plainlinks"> | ||
− | [[File:PPT.jpg|60px|link=]] | + | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/7/71/Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pptx]] |
</span> | </span> | ||
− | <br> | + | <br> [http://www.ecc.itu.edu.tr/images/7/71/Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pptx Slides] |
− | Slides | + | |
|} | |} | ||
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| Furkan Peker and [[Mustafa Altun]] | | Furkan Peker and [[Mustafa Altun]] | ||
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− | | ''' | + | | '''appeared in''': |
− | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6687315 IEEE Transactions on Multi-Scale Computing Systems], | + | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6687315 IEEE Transactions on Multi-Scale Computing Systems], Vol. 4, No. 4, pp. 522–532, 2018. |
|} | |} | ||
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| '''appeared in''': | | '''appeared in''': | ||
− | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems], Vol. 36, Issue 5, pp. | + | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems], Vol. 36, Issue 5, pp. 747–760, 2017. |
|} | |} | ||
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<span class="plainlinks"> | <span class="plainlinks"> | ||
− | [[File:PPT.jpg|60px|link=]] | + | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/5/54/Aksoy_Altun_SAT_based_Synthesis_of_Switching_Lattices.pptx]] |
</span> | </span> | ||
− | <br> | + | <br> [http://www.ecc.itu.edu.tr/images/5/54/Aksoy_Altun_SAT_based_Synthesis_of_Switching_Lattices.pptx Slides] |
− | Slides | + | |
|} | |} | ||
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| Ceylan Morgul and [[Mustafa Altun]] | | Ceylan Morgul and [[Mustafa Altun]] | ||
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− | | ''' | + | | '''appeared in''': |
− | | width="624" | [http://www.journals.elsevier.com/integration Integration, the VLSI Journal], | + | | width="624" | [http://www.journals.elsevier.com/integration Integration, the VLSI Journal], Vol. 64, pp. 60–70, 2019. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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− | == Reversible | + | == Reversible Computing == |
+ | |||
+ | === CMOS Fault Tolerance === | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
+ | |||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="550"|[[Media:Parvin_Altun_CMOS_Fault_Tolerance_with_Preservative_Reversible_Gates.pdf | Implementation of CMOS Logic Circuits with Perfect Fault Detection Using Preservative Reversible Gates]] | ||
+ | |- valign="top" | ||
+ | | '''authors''': | ||
+ | | Sajjad Parvin and [[Mustafa Altun]] | ||
+ | |- valign=top | ||
+ | | '''presented at''': | ||
+ | | width="550"| [http://tima.univ-grenoble-alpes.fr/conferences/iolts/iolts19/ IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS)], Rhodes Island, Greece, 2019. | ||
+ | |} | ||
+ | |||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/e/ee/Parvin_Altun_CMOS_Fault_Tolerance_with_Preservative_Reversible_Gates.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Parvin_Altun_CMOS_Fault_Tolerance_with_Preservative_Reversible_Gates.pdf | Paper]] | ||
+ | | align="center" width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | |||
+ | [[File:PPT.jpg|60px|link=]] | ||
+ | </span> | ||
+ | <br> Poster | ||
+ | |} | ||
{| style="border:2px solid #abd5f5; background:#f1f5fc; " | {| style="border:2px solid #abd5f5; background:#f1f5fc; " | ||
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| [[Mustafa Altun]], Sajjad Parvin, and Husrev Cilasun | | [[Mustafa Altun]], Sajjad Parvin, and Husrev Cilasun | ||
|- valign="top" | |- valign="top" | ||
− | | ''' | + | | '''appeared in''': |
− | | [http://ieeeaccess.ieee.org/ IEEE Access], 2018. | + | | [http://ieeeaccess.ieee.org/ IEEE Access], Vol. 6, pp. 74475–74484, 2018. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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| '''appeared in''': | | '''appeared in''': | ||
− | | [http://www.journals.istanbul.edu.tr/iujeee/index Istanbul University - Journal of Electrical & Electronics Engineering], Vol. 17, No. 1, pp. 3147 | + | | [http://www.journals.istanbul.edu.tr/iujeee/index Istanbul University - Journal of Electrical & Electronics Engineering], Vol. 17, No. 1, pp. 3147–3154, 2017. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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|} | |} | ||
+ | |||
+ | === Logic Synthesis === | ||
{| style="border:2px solid #abd5f5; background:#f1f5fc; " | {| style="border:2px solid #abd5f5; background:#f1f5fc; " | ||
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| '''appeared in''': | | '''appeared in''': | ||
− | | [http://www.oldcitypublishing.com/journals/mvlsc-home/ Journal of Multiple-Valued Logic and Soft Computing], Vol. 29, Issue 1-2, pp. | + | | [http://www.oldcitypublishing.com/journals/mvlsc-home/ Journal of Multiple-Valued Logic and Soft Computing], Vol. 29, Issue 1-2, pp. 1–23, 2017. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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| Tuba Ayhan and [[Mustafa Altun]] | | Tuba Ayhan and [[Mustafa Altun]] | ||
|- valign="top" | |- valign="top" | ||
− | | ''' | + | | '''appeared in''': |
− | | [http://ieeeaccess.ieee.org/ IEEE Access], | + | | [http://ieeeaccess.ieee.org/ IEEE Access], Vol. 7, pp. 4726–4734, 2019. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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| '''presented at''': | | '''presented at''': | ||
− | | width="550"| [http:// | + | | width="550"| [http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001786 Sinyal İşleme ve İletişim Uygulamaları Kurultayı (SİU)], Izmir, Turkey, 2018. |
|} | |} | ||
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| '''appeared in''': | | '''appeared in''': | ||
− | | [http://journals.tubitak.gov.tr/elektrik/index.htm;jsessionid=848207EBE52EFE10C78B78C76A0FEAD9 Turkish Journal of Electrical Engineering and Computer Sciences], Vol. 25, No. 4, pp. | + | | [http://journals.tubitak.gov.tr/elektrik/index.htm;jsessionid=848207EBE52EFE10C78B78C76A0FEAD9 Turkish Journal of Electrical Engineering and Computer Sciences], Vol. 25, No. 4, pp. 3240–3252, 2017. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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| '''appeared in''': | | '''appeared in''': | ||
− | | [http://www.journals.elsevier.com/reliability-engineering-and-system-safety Reliability Engineering and System Safety], Vol. 156, pp. | + | | [http://www.journals.elsevier.com/reliability-engineering-and-system-safety Reliability Engineering and System Safety], Vol. 156, pp. 175–184, 2016. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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</span> | </span> | ||
<br> [http://www.ecc.itu.edu.tr/images/e/eb/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pptx Slides] | <br> [http://www.ecc.itu.edu.tr/images/e/eb/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pptx Slides] | ||
+ | |} | ||
+ | |||
+ | ==== National Publications in Turkish ==== | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
+ | |||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="550"|[[Media:Avci_Altun_Reliability Model_for_MOSFET_GOB.pdf | A New Reliability Model for MOSFET Gate Oxide Breakdown]] | ||
+ | |- valign="top | ||
+ | | width="100" |'''title (in Turkish)''': | ||
+ | | width="550"|[[Media:Avci_Altun_Reliability_Model_for_MOSFET_GOB.pdf | MOSFET Geçit Oksidi Kırılması için Yeni Bir Güvenilirlik Modeli]] | ||
+ | |- valign="top | ||
+ | | '''authors''': | ||
+ | | Hasan Avci and [[Mustafa Altun]] | ||
+ | |- valign="top" | ||
+ | | '''presented at''': | ||
+ | | width="550"| [http://www.eleco.org.tr/ Elektrik, Elektronik, Bilgisayar ve Biyomedikal Mühendisliği Sempozyumu (ELECO)], Bursa, Turkey, 2018. | ||
+ | |} | ||
+ | |||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | |||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/6/6f/Avci_Altun_Reliability_Model_for_MOSFET_GOB.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Avci_Altun_Reliability_Model_for_MOSFET_GOB.pdf | Paper]] | ||
+ | |||
+ | | align="center" width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | |||
+ | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/f/f9/Avci_Altun_Reliability_Model_for_MOSFET_GOB.pptx]] | ||
+ | </span> | ||
+ | <br> [http://www.ecc.itu.edu.tr/images/f/f9/Avci_Altun_Reliability_Model_for_MOSFET_GOB.pptx Slides] | ||
|} | |} | ||
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| '''appeared in''': | | '''appeared in''': | ||
− | | [http://www.springer.com/mathematics/applications/journal/10255 Acta Mathematicae Applicatae Sinica - English Series], Vol. 33, Issue 1, pp. 43 | + | | [http://www.springer.com/mathematics/applications/journal/10255 Acta Mathematicae Applicatae Sinica - English Series], Vol. 33, Issue 1, pp. 43–52, 2017. |
|} | |} | ||
Revision as of 12:57, 17 April 2019
Listed below are the papers, first authored by our group members as an indication that the related research is mainly conducted in our group, and the presentations. Research topics are ordered from newest to oldest as well as by considering their importance. Under each topic, papers are ordered from newest to oldest. All materials are subject to copyrights.
Contents |
Computing with Nano-Crossbar Arrays
Technology Development
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Comprehensive Performance Optimization
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Fault/Defect/Variation Tolerance
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Logic Synthesis
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National Publications in Turkish
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Reversible Computing
CMOS Fault Tolerance
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Logic Synthesis
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National Publications in Turkish
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Stochastic and Bit Stream Computing
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National Publications in Turkish
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Approximate Computing
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National Publications in Turkish
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Large-Area Electronics
Organic Transistor Modeling
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Reliability of Electronic Products
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National Publications in Turkish
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Analog Circuit Design
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National Publications in Turkish
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Discrete Mathematics
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