Publications and Presentations
From The Emerging Circuits and Computation Group at ITU
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− | Listed below are the papers, '''first authored''' by our group members as an indication that the related research is mainly conducted in our group, and the presentations. All materials are subject to copyrights. | + | Listed below are the papers, '''first authored''' by our group members as an indication that the related research is mainly conducted in our group, and the presentations. Research topics are ordered from newest to oldest as well as by considering their importance. Under each topic, papers are ordered from newest to oldest. All materials are subject to copyrights. |
<div style="float:center; font-size:110%; font-weight:bold; clear:both; padding:0; margin:0.0em;">__TOC__</div> | <div style="float:center; font-size:110%; font-weight:bold; clear:both; padding:0; margin:0.0em;">__TOC__</div> | ||
== Computing with Nano-Crossbar Arrays == | == Computing with Nano-Crossbar Arrays == | ||
− | === Comprehensive === | + | === Technology Development === |
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
+ | |||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="550"|[[Media: Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pdf| Realization of Four-Terminal Switching Lattices: Technology Development and Circuit Modeling]] | ||
+ | |- valign="top" | ||
+ | | '''authors''': | ||
+ | | width="550"| Serzat Safaltin, Oguz Gencer, Ceylan Morgul, Levent Aksoy, Sebahattin Gurmen, Csaba Andras Moritz, and [[Mustafa Altun]] | ||
+ | |- valign="top" | ||
+ | | '''presented at''': | ||
+ | | width="550"| [http://www.date-conference.com/ Design, Automation and Test in Europe (DATE)], Florence, Italy, 2019. | ||
+ | |} | ||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/2/2c/Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pdf | Paper]] | ||
+ | | align="center" width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | |||
+ | [[File:PPT.jpg|60px|link=]] | ||
+ | </span> | ||
+ | <br> | ||
+ | Slides | ||
+ | |} | ||
+ | |||
+ | === Comprehensive Performance Optimization=== | ||
{| style="border:2px solid #abd5f5; background:#f1f5fc;" | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
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<br> [http://www.ecc.itu.edu.tr/images/5/5a/Morgul_Peker_Altun_Power-Delay-Area_Performance_Modeling_and_Analysis_for_Nano-Crossbar_Arrays.pptx Poster] | <br> [http://www.ecc.itu.edu.tr/images/5/5a/Morgul_Peker_Altun_Power-Delay-Area_Performance_Modeling_and_Analysis_for_Nano-Crossbar_Arrays.pptx Poster] | ||
|} | |} | ||
+ | |||
+ | === Fault/Defect/Variation Tolerance === | ||
{| style="border:2px solid #abd5f5; background:#f1f5fc;" | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
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|- valign=top | |- valign=top | ||
| width="100" |'''title''': | | width="100" |'''title''': | ||
− | | width=" | + | | width="624"|[[Media:Tunali_Morgul_Altun_Defect_Tolerant_Memristor_Crossbars.pdf | Defect Tolerant Logic Synthesis for Memristor Crossbars with Performance Evaluation]] |
|- valign="top" | |- valign="top" | ||
| '''authors''': | | '''authors''': | ||
− | | Onur Tunali and [[Mustafa Altun]] | + | | Onur Tunali, Ceylan Morgul, and [[Mustafa Altun]] |
|- valign="top" | |- valign="top" | ||
− | | ''' | + | | '''appeared in''': |
− | | width=" | + | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=40 IEEE Micro], Vol. 38, Issue 5, pp. 22–31, 2018. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
<span class="plainlinks"> | <span class="plainlinks"> | ||
− | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/ | + | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/d/db/Tunali_Morgul_Altun_Defect_Tolerant_Memristor_Crossbars.pdf]]</span> |
<br> | <br> | ||
− | [[Media: | + | [[Media:Tunali_Morgul_Altun_Defect_Tolerant_Memristor_Crossbars.pdf | Paper]] |
− | + | ||
− | + | ||
− | + | ||
− | + | ||
− | + | ||
− | + | ||
|} | |} | ||
− | |||
− | |||
{| style="border:2px solid #abd5f5; background:#f1f5fc;" | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
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| Furkan Peker and [[Mustafa Altun]] | | Furkan Peker and [[Mustafa Altun]] | ||
|- valign="top" | |- valign="top" | ||
− | | ''' | + | | '''appeared in''': |
− | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6687315 IEEE Transactions on Multi-Scale Computing Systems], | + | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6687315 IEEE Transactions on Multi-Scale Computing Systems], Vol. 4, No. 4, pp. 522–532, 2018. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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|- valign="top" | |- valign="top" | ||
| '''appeared in''': | | '''appeared in''': | ||
− | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems], Vol. 36, Issue 5, pp. | + | | width="624" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems], Vol. 36, Issue 5, pp. 747–760, 2017. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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<br> | <br> | ||
[[Media:Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf | Paper]] | [[Media:Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf | Paper]] | ||
+ | |} | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="550"|[[Media:Tunali_Altun_Defect_Tolerance_in_Diode_FET_and_Four-Terminal_Switch_based_Nano-Crossbar_Arrays.pdf | Defect Tolerance in Diode FET and Four-Terminal Switch Based Nano-Crossbar Arrays]] | ||
+ | |- valign="top" | ||
+ | | '''authors''': | ||
+ | | Onur Tunali and [[Mustafa Altun]] | ||
+ | |- valign="top" | ||
+ | | '''presented at''': | ||
+ | | width="550"|[http://www.nanoarch.org/ IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH)], Boston, USA, 2015. | ||
+ | |} | ||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/e/ee/Tunali_Altun_Defect_Tolerance_in_Diode_FET_and_Four-Terminal_Switch_based_Nano-Crossbar_Arrays.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Tunali_Altun_Defect_Tolerance_in_Diode_FET_and_Four-Terminal_Switch_based_Nano-Crossbar_Arrays.pdf | Paper]] | ||
+ | | align="center" width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | |||
+ | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/f/f9/Tunali_Altun_Defect_Tolerance_in_Diode_FET_and_Four-Terminal_Switch_based_Nano-Crossbar_Arrays.pptx]] | ||
+ | </span> | ||
+ | <br> [http://www.ecc.itu.edu.tr/images/f/f9/Tunali_Altun_Defect_Tolerance_in_Diode_FET_and_Four-Terminal_Switch_based_Nano-Crossbar_Arrays.pptx Slides] | ||
|} | |} | ||
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=== Logic Synthesis === | === Logic Synthesis === | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
+ | |||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="550"|[[Media: Aksoy_Altun_SAT_based_Synthesis_of_Switching_Lattices.pdf| A Satisfiability-Based Approximate Algorithm for Logic Synthesis Using Switching Lattices]] | ||
+ | |- valign="top" | ||
+ | | '''authors''': | ||
+ | | Levent Aksoy and [[Mustafa Altun]] | ||
+ | |- valign="top" | ||
+ | | '''presented at''': | ||
+ | | width="550"| [http://www.date-conference.com/ Design, Automation and Test in Europe (DATE)], Florence, Italy, 2019. | ||
+ | |} | ||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/f/fe/Aksoy_Altun_SAT_based_Synthesis_of_Switching_Lattices.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Aksoy_Altun_SAT_based_Synthesis_of_Switching_Lattices.pdf | Paper]] | ||
+ | | align="center" width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | |||
+ | [[File:PPT.jpg|60px|link=]] | ||
+ | </span> | ||
+ | <br> | ||
+ | Slides | ||
+ | |} | ||
{| style="border:2px solid #abd5f5; background:#f1f5fc;" | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
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| Ceylan Morgul and [[Mustafa Altun]] | | Ceylan Morgul and [[Mustafa Altun]] | ||
|- valign="top" | |- valign="top" | ||
− | | ''' | + | | '''appeared in''': |
− | | width="624" | [http://www.journals.elsevier.com/integration Integration, the VLSI Journal], | + | | width="624" | [http://www.journals.elsevier.com/integration Integration, the VLSI Journal], Vol. 64, pp. 60–70, 2019. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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== Reversible Circuit Design == | == Reversible Circuit Design == | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc; " | ||
+ | |||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="624"|[[Media:Altun_Parvin_Cilasun_Exploiting_Reversible_Computing_for_CMOS_Fault_Tolerance.pdf| Exploiting Reversible Computing for Latent-Fault-Free Error Detecting/Correcting CMOS Circuits | ||
+ | ]] | ||
+ | |- valign="top" | ||
+ | | '''authors''': | ||
+ | | [[Mustafa Altun]], Sajjad Parvin, and Husrev Cilasun | ||
+ | |- valign="top" | ||
+ | | '''appeared in''': | ||
+ | | [http://ieeeaccess.ieee.org/ IEEE Access], Vol. 6, pp. 74475–74484, 2018. | ||
+ | |} | ||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/7/7d/Altun_Parvin_Cilasun_Exploiting_Reversible_Computing_for_CMOS_Fault_Tolerance.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Altun_Parvin_Cilasun_Exploiting_Reversible_Computing_for_CMOS_Fault_Tolerance.pdf | Paper]] | ||
+ | |||
+ | |} | ||
{| style="border:2px solid #abd5f5; background:#f1f5fc; " | {| style="border:2px solid #abd5f5; background:#f1f5fc; " | ||
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|- valign="top" | |- valign="top" | ||
| '''appeared in''': | | '''appeared in''': | ||
− | | [http://www.journals.istanbul.edu.tr/iujeee/index Istanbul University - Journal of Electrical & Electronics Engineering], Vol. 17, No. 1, pp. 3147 | + | | [http://www.journals.istanbul.edu.tr/iujeee/index Istanbul University - Journal of Electrical & Electronics Engineering], Vol. 17, No. 1, pp. 3147–3154, 2017. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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|- valign="top" | |- valign="top" | ||
| '''appeared in''': | | '''appeared in''': | ||
− | | [http://www.oldcitypublishing.com/journals/mvlsc-home/ Journal of Multiple-Valued Logic and Soft Computing], Vol. 29, Issue 1-2, pp. | + | | [http://www.oldcitypublishing.com/journals/mvlsc-home/ Journal of Multiple-Valued Logic and Soft Computing], Vol. 29, Issue 1-2, pp. 1–23, 2017. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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| Ensar Vahapoglu and [[Mustafa Altun]] | | Ensar Vahapoglu and [[Mustafa Altun]] | ||
|- valign="top" | |- valign="top" | ||
− | | ''' | + | | '''appeared in''': |
− | | width="624" | | + | | width="624" | arXiv, 1805.06262, 2018. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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== Approximate Computing == | == Approximate Computing == | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc; " | ||
+ | |||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="624"|[[Media:Ayhan_Altun_Circuit_Aware_Approximate_System_Design.pdf| Circuit Aware Approximate System Design with Case Studies in Image Processing and Neural Networks]] | ||
+ | |- valign="top" | ||
+ | | '''authors''': | ||
+ | | Tuba Ayhan and [[Mustafa Altun]] | ||
+ | |- valign="top" | ||
+ | | '''appeared in''': | ||
+ | | [http://ieeeaccess.ieee.org/ IEEE Access], Vol. 7, pp. 4726–4734, 2019. | ||
+ | |} | ||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/9/90/Ayhan_Altun_Circuit_Aware_Approximate_System_Design.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Ayhan_Altun_Circuit_Aware_Approximate_System_Design.pdf | Paper]] | ||
+ | |||
+ | |} | ||
{| style="border:2px solid #abd5f5; background:#f1f5fc;" | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
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|- valign="top" | |- valign="top" | ||
| '''presented at''': | | '''presented at''': | ||
− | | width="550"| [http:// | + | | width="550"| [http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001786 Sinyal İşleme ve İletişim Uygulamaları Kurultayı (SİU)], Izmir, Turkey, 2018. |
|} | |} | ||
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|- valign="top" | |- valign="top" | ||
| '''appeared in''': | | '''appeared in''': | ||
− | | [http://journals.tubitak.gov.tr/elektrik/index.htm;jsessionid=848207EBE52EFE10C78B78C76A0FEAD9 Turkish Journal of Electrical Engineering and Computer Sciences], Vol. 25, No. 4, pp. | + | | [http://journals.tubitak.gov.tr/elektrik/index.htm;jsessionid=848207EBE52EFE10C78B78C76A0FEAD9 Turkish Journal of Electrical Engineering and Computer Sciences], Vol. 25, No. 4, pp. 3240–3252, 2017. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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|- valign="top" | |- valign="top" | ||
| '''appeared in''': | | '''appeared in''': | ||
− | | [http://www.journals.elsevier.com/reliability-engineering-and-system-safety Reliability Engineering and System Safety], Vol. 156, pp. | + | | [http://www.journals.elsevier.com/reliability-engineering-and-system-safety Reliability Engineering and System Safety], Vol. 156, pp. 175–184, 2016. |
|} | |} | ||
| align=center width="70" | | | align=center width="70" | | ||
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</span> | </span> | ||
<br> [http://www.ecc.itu.edu.tr/images/e/eb/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pptx Slides] | <br> [http://www.ecc.itu.edu.tr/images/e/eb/Comert_Yadavari_Altun_Erturk_Reliability_Prediction_of_Electronic_Boards_by_Analyzing_Field_Return_Data.pptx Slides] | ||
+ | |} | ||
+ | |||
+ | ==== National Publications in Turkish ==== | ||
+ | |||
+ | {| style="border:2px solid #abd5f5; background:#f1f5fc;" | ||
+ | |||
+ | | | ||
+ | {| | ||
+ | |- valign=top | ||
+ | | width="100" |'''title''': | ||
+ | | width="550"|[[Media:Avci_Altun_Reliability Model_for_MOSFET_GOB.pdf | A New Reliability Model for MOSFET Gate Oxide Breakdown]] | ||
+ | |- valign="top | ||
+ | | width="100" |'''title (in Turkish)''': | ||
+ | | width="550"|[[Media:Avci_Altun_Reliability_Model_for_MOSFET_GOB.pdf | MOSFET Geçit Oksidi Kırılması için Yeni Bir Güvenilirlik Modeli]] | ||
+ | |- valign="top | ||
+ | | '''authors''': | ||
+ | | Hasan Avci and [[Mustafa Altun]] | ||
+ | |- valign="top" | ||
+ | | '''presented at''': | ||
+ | | width="550"| [http://www.eleco.org.tr/ Elektrik, Elektronik, Bilgisayar ve Biyomedikal Mühendisliği Sempozyumu (ELECO)], Bursa, Turkey, 2018. | ||
+ | |} | ||
+ | |||
+ | | align=center width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | |||
+ | [[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/6/6f/Avci_Altun_Reliability_Model_for_MOSFET_GOB.pdf]]</span> | ||
+ | <br> | ||
+ | [[Media:Avci_Altun_Reliability_Model_for_MOSFET_GOB.pdf | Paper]] | ||
+ | |||
+ | | align="center" width="70" | | ||
+ | <span class="plainlinks"> | ||
+ | |||
+ | [[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/f/f9/Avci_Altun_Reliability_Model_for_MOSFET_GOB.pptx]] | ||
+ | </span> | ||
+ | <br> [http://www.ecc.itu.edu.tr/images/f/f9/Avci_Altun_Reliability_Model_for_MOSFET_GOB.pptx Slides] | ||
|} | |} | ||
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|- valign="top" | |- valign="top" | ||
| '''appeared in''': | | '''appeared in''': | ||
− | | [http://www.springer.com/mathematics/applications/journal/10255 Acta Mathematicae Applicatae Sinica - English Series], Vol. 33, Issue 1, pp. 43 | + | | [http://www.springer.com/mathematics/applications/journal/10255 Acta Mathematicae Applicatae Sinica - English Series], Vol. 33, Issue 1, pp. 43–52, 2017. |
|} | |} | ||
Revision as of 23:48, 31 January 2019
Listed below are the papers, first authored by our group members as an indication that the related research is mainly conducted in our group, and the presentations. Research topics are ordered from newest to oldest as well as by considering their importance. Under each topic, papers are ordered from newest to oldest. All materials are subject to copyrights.
Contents |
Computing with Nano-Crossbar Arrays
Technology Development
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Comprehensive Performance Optimization
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Fault/Defect/Variation Tolerance
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Logic Synthesis
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National Publications in Turkish
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Reversible Circuit Design
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National Publications in Turkish
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Stochastic and Bit Stream Computing
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National Publications in Turkish
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Approximate Computing
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National Publications in Turkish
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Large-Area Electronics
Organic Transistor Modeling
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Reliability of Electronic Products
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National Publications in Turkish
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Analog Circuit Design
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National Publications in Turkish
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Discrete Mathematics
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